Reconstructing Surfaces from Optical Fringe Data
Experimental
techniques for measuring properties of physical systems have been carefully
developed so they do not disturb the systems being measured; these are called
nondestructive measurement techniques.
The data collected in the measurements are generally indirect, i.e. they
must be processed or interpreted in some way to yield the desired measurement
information. We will carefully
consider the mathematical structure and limitations of the data reconstruction
process for optical interferograms.
Interferograms
are images composed of alternating bright and dark bands (or ÔÕfringesÕÕ)
generated by constructive and destructive interference of coherent light being
reflected from the surfaces of a thin layer of a material, see Figure 1. The presence of fringes implies a
change in the thickness of the material layer and hence interferograms resemble
topographical maps of surfaces [1] (the key difficulty is that none of the
height contours are labeled). The
particular application we are concerned with is determining a height surface
for a thin layer of a fluid spreading on a flat solid surface from
interferometric data.

Figure 1.
Sample interferogram image.
The
background of this problem is basic optics from physics and geometry from
mathematics, but there are many questions about the reconstruction process that
require further analysis:
References:
[1] H. E. Cline, A. S. Holik
and W. E. Lorensen, Computer-aided surface reconstruction of interference
contours, Applied Optics, 21(24): 4481-4488, 1982.
[2] G. Da Costa and R.
Escalona, Time evolution of the caustics of a laser heated liquid film, Applied
Optics, 29(7): 1023-1033, 1990.
[3] R. Escalona and C. Rosi,
Space and time characterization of a thermal lens using an interferometric
technique, Optical Engineering, 38(9): 1591-1595, 1999.